The performance of a reliability system can be improved by different methods, e.g. the reliability of one or more components can be improved, hot or cold redundant components can be added to the system. Sometimes these measures can be equivalent as they will have the same effect on some performance measure of the system. This paper discusses the reliability equivalences of a parallel–series system. The system considered here consists of m subsystems connected in parallel, with subsystem i consisting of ni independent and identical components in series for i=1, 2, …, m. Three different methods are used to improve the system reliability: (i) the reduction method, (ii) the hot duplication method and (iii) the cold duplication method. Each component of the system has four states and two types of partial failure rates. In this study, the lifetimes of the system components are exponentially distributed. A numerical example is introduced to illustrate how the idea of this work can be applied.
| Published in | Science Journal of Applied Mathematics and Statistics (Volume 3, Issue 3) |
| DOI | 10.11648/j.sjams.20150303.19 |
| Page(s) | 160-164 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
| Copyright |
Copyright © The Author(s), 2015. Published by Science Publishing Group |
Partial Failure Rate, Reliability Equivalence Factors, Parallel-Series System
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APA Style
M. A. El-Damcese. (2015). Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility. Science Journal of Applied Mathematics and Statistics, 3(3), 160-164. https://doi.org/10.11648/j.sjams.20150303.19
ACS Style
M. A. El-Damcese. Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility. Sci. J. Appl. Math. Stat. 2015, 3(3), 160-164. doi: 10.11648/j.sjams.20150303.19
AMA Style
M. A. El-Damcese. Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility. Sci J Appl Math Stat. 2015;3(3):160-164. doi: 10.11648/j.sjams.20150303.19
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Download@article{10.11648/j.sjams.20150303.19,
author = {M. A. El-Damcese},
title = {Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility},
journal = {Science Journal of Applied Mathematics and Statistics},
volume = {3},
number = {3},
pages = {160-164},
doi = {10.11648/j.sjams.20150303.19},
url = {https://doi.org/10.11648/j.sjams.20150303.19},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.sjams.20150303.19},
abstract = {The performance of a reliability system can be improved by different methods, e.g. the reliability of one or more components can be improved, hot or cold redundant components can be added to the system. Sometimes these measures can be equivalent as they will have the same effect on some performance measure of the system. This paper discusses the reliability equivalences of a parallel–series system. The system considered here consists of m subsystems connected in parallel, with subsystem i consisting of ni independent and identical components in series for i=1, 2, …, m. Three different methods are used to improve the system reliability: (i) the reduction method, (ii) the hot duplication method and (iii) the cold duplication method. Each component of the system has four states and two types of partial failure rates. In this study, the lifetimes of the system components are exponentially distributed. A numerical example is introduced to illustrate how the idea of this work can be applied.},
year = {2015}
}
TY - JOUR T1 - Reliability Equivalence Analysis of a Parallel-Series System Subject to Degradation Facility AU - M. A. El-Damcese Y1 - 2015/06/08 PY - 2015 N1 - https://doi.org/10.11648/j.sjams.20150303.19 DO - 10.11648/j.sjams.20150303.19 T2 - Science Journal of Applied Mathematics and Statistics JF - Science Journal of Applied Mathematics and Statistics JO - Science Journal of Applied Mathematics and Statistics SP - 160 EP - 164 PB - Science Publishing Group SN - 2376-9513 UR - https://doi.org/10.11648/j.sjams.20150303.19 AB - The performance of a reliability system can be improved by different methods, e.g. the reliability of one or more components can be improved, hot or cold redundant components can be added to the system. Sometimes these measures can be equivalent as they will have the same effect on some performance measure of the system. This paper discusses the reliability equivalences of a parallel–series system. The system considered here consists of m subsystems connected in parallel, with subsystem i consisting of ni independent and identical components in series for i=1, 2, …, m. Three different methods are used to improve the system reliability: (i) the reduction method, (ii) the hot duplication method and (iii) the cold duplication method. Each component of the system has four states and two types of partial failure rates. In this study, the lifetimes of the system components are exponentially distributed. A numerical example is introduced to illustrate how the idea of this work can be applied. VL - 3 IS - 3 ER -
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