Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range

Patrick Damson Nsimama

doi:doi:10.11648/j.ajop.20180601.11

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Characterization of Laser Ablated SrAl₂O₄:Eu²⁺, Dy³⁺ Thin Films Deposited on the Optimum Substrate Temperature Range

Patrick Damson Nsimama

Published in American Journal of Optics and Photonics (Volume 6, Issue 1)

Received: 18 November 2017 Accepted: 21 December 2017 Published: 16 January 2018

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Abstract

The morphological, structural and photoluminescence (PL) of laser ablated SrAl₂O₄:Eu²⁺, Dy³⁺ thin films deposited on optimum substrate temperature range of 200-500°C are reported. The 200-500°C substrate temperature was considered, since on that range, low cost highly emitting SrAl₂O₄:Eu²⁺, Dy³⁺ thin films are always produced. The surface morphology analysis of the films was done by using the scanning electron microscopy (SEM) and atomic force microscopy (AFM). The energy dispersive X-ray spectrometer (EDS) was employed for elemental composition analysis. The structural analysis was done by the X-ray diffraction (XRD) technique. The photoluminescence (PL) data collection was done by using Cary Eclipse fluorescence spectrophotometry. The films were excited by the UV light from the xenon lamp. The highest green emission intensity with a peak at 517 nm and highest initial afterglow intensity were recorded by the sample that was deposited at 350°C. The green peak at 517 nm is attributed to 4f⁶5d¹ → 4f7 Eu²⁺ transitions. AFM images with well defined grains were observed on the films deposited at temperatures higher than 200°C. The EDS elemental composition analysis showed that the films consist of all the main elements of SrAl₂O₄:Eu²⁺, Dy³⁺, i.e., Al, Sr, O. The changes in the film photoluminescence and morphology with the substrate temperature are discussed.

Published in	American Journal of Optics and Photonics (Volume 6, Issue 1)
DOI	10.11648/j.ajop.20180601.11
Page(s)	1-7
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2018. Published by Science Publishing Group

Keywords

SrAl₂O₄:Eu²⁺, Dy³⁺, SEM, AFM, Thin Film, Substrate Temperature, PL

References

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[2]	Patrick D. Nsimama, O. M. Ntwaeaborwa and H. C. Swart, (2015). The XPS, depth profile analysis and photoluminescence studies of pulsed laser deposited SrAl₂O₄: Eu²⁺, Dy³⁺thin films prepared using different laser fluencies. International Journal of Scientific & Engineering Research, 6, 1-16.
[3]	P. D. Nsimama, (2016). The influence of oxygen pressure on the Photoluminescent properties of pulsed laser ablated SrAl₂O₄: Eu²⁺, Dy³⁺ thin film. American Journal of Optics and Photonics, 4, 25-31.
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Patrick Damson Nsimama. (2018). Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range. American Journal of Optics and Photonics, 6(1), 1-7. https://doi.org/10.11648/j.ajop.20180601.11

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ACS Style

Patrick Damson Nsimama. Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range. Am. J. Opt. Photonics 2018, 6(1), 1-7. doi: 10.11648/j.ajop.20180601.11

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AMA Style

Patrick Damson Nsimama. Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range. Am J Opt Photonics. 2018;6(1):1-7. doi: 10.11648/j.ajop.20180601.11

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@article{10.11648/j.ajop.20180601.11,
  author = {Patrick Damson Nsimama},
  title = {Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range},
  journal = {American Journal of Optics and Photonics},
  volume = {6},
  number = {1},
  pages = {1-7},
  doi = {10.11648/j.ajop.20180601.11},
  url = {https://doi.org/10.11648/j.ajop.20180601.11},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajop.20180601.11},
  abstract = {The morphological, structural and photoluminescence (PL) of laser ablated SrAl2O4:Eu2+, Dy3+ thin films deposited on optimum substrate temperature range of 200-500°C are reported. The 200-500°C substrate temperature was considered, since on that range, low cost highly emitting SrAl2O4:Eu2+, Dy3+ thin films are always produced. The surface morphology analysis of the films was done by using the scanning electron microscopy (SEM) and atomic force microscopy (AFM). The energy dispersive X-ray spectrometer (EDS) was employed for elemental composition analysis. The structural analysis was done by the X-ray diffraction (XRD) technique. The photoluminescence (PL) data collection was done by using Cary Eclipse fluorescence spectrophotometry. The films were excited by the UV light from the xenon lamp. The highest green emission intensity with a peak at 517 nm and highest initial afterglow intensity were recorded by the sample that was deposited at 350°C. The green peak at 517 nm is attributed to 4f65d1 → 4f7 Eu2+ transitions. AFM images with well defined grains were observed on the films deposited at temperatures higher than 200°C. The EDS elemental composition analysis showed that the films consist of all the main elements of SrAl2O4:Eu2+, Dy3+, i.e., Al, Sr, O. The changes in the film photoluminescence and morphology with the substrate temperature are discussed.},
 year = {2018}
}

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TY - JOUR
T1 - Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range
AU - Patrick Damson Nsimama
Y1 - 2018/01/16
PY - 2018
N1 - https://doi.org/10.11648/j.ajop.20180601.11
DO - 10.11648/j.ajop.20180601.11
T2 - American Journal of Optics and Photonics
JF - American Journal of Optics and Photonics
JO - American Journal of Optics and Photonics
SP - 1
EP - 7
PB - Science Publishing Group
SN - 2330-8494
UR - https://doi.org/10.11648/j.ajop.20180601.11
AB - The morphological, structural and photoluminescence (PL) of laser ablated SrAl2O4:Eu2+, Dy3+ thin films deposited on optimum substrate temperature range of 200-500°C are reported. The 200-500°C substrate temperature was considered, since on that range, low cost highly emitting SrAl2O4:Eu2+, Dy3+ thin films are always produced. The surface morphology analysis of the films was done by using the scanning electron microscopy (SEM) and atomic force microscopy (AFM). The energy dispersive X-ray spectrometer (EDS) was employed for elemental composition analysis. The structural analysis was done by the X-ray diffraction (XRD) technique. The photoluminescence (PL) data collection was done by using Cary Eclipse fluorescence spectrophotometry. The films were excited by the UV light from the xenon lamp. The highest green emission intensity with a peak at 517 nm and highest initial afterglow intensity were recorded by the sample that was deposited at 350°C. The green peak at 517 nm is attributed to 4f65d1 → 4f7 Eu2+ transitions. AFM images with well defined grains were observed on the films deposited at temperatures higher than 200°C. The EDS elemental composition analysis showed that the films consist of all the main elements of SrAl2O4:Eu2+, Dy3+, i.e., Al, Sr, O. The changes in the film photoluminescence and morphology with the substrate temperature are discussed.
VL - 6
IS - 1
ER -

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Patrick Damson Nsimama

Department of Science and Laboratory Technology, Dar Es Salaam Institute of Technology, Dar Es Salaam, Tanzania

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Plain Text BibTeX RIS

APA Style

Patrick Damson Nsimama. (2018). Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range. American Journal of Optics and Photonics, 6(1), 1-7. https://doi.org/10.11648/j.ajop.20180601.11

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ACS Style

Patrick Damson Nsimama. Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range. Am. J. Opt. Photonics 2018, 6(1), 1-7. doi: 10.11648/j.ajop.20180601.11

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AMA Style

Patrick Damson Nsimama. Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range. Am J Opt Photonics. 2018;6(1):1-7. doi: 10.11648/j.ajop.20180601.11

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@article{10.11648/j.ajop.20180601.11,
  author = {Patrick Damson Nsimama},
  title = {Characterization of Laser Ablated SrAl2O4:Eu2+, Dy3+ Thin Films Deposited on the Optimum Substrate Temperature Range},
  journal = {American Journal of Optics and Photonics},
  volume = {6},
  number = {1},
  pages = {1-7},
  doi = {10.11648/j.ajop.20180601.11},
  url = {https://doi.org/10.11648/j.ajop.20180601.11},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajop.20180601.11},
  abstract = {The morphological, structural and photoluminescence (PL) of laser ablated SrAl2O4:Eu2+, Dy3+ thin films deposited on optimum substrate temperature range of 200-500°C are reported. The 200-500°C substrate temperature was considered, since on that range, low cost highly emitting SrAl2O4:Eu2+, Dy3+ thin films are always produced. The surface morphology analysis of the films was done by using the scanning electron microscopy (SEM) and atomic force microscopy (AFM). The energy dispersive X-ray spectrometer (EDS) was employed for elemental composition analysis. The structural analysis was done by the X-ray diffraction (XRD) technique. The photoluminescence (PL) data collection was done by using Cary Eclipse fluorescence spectrophotometry. The films were excited by the UV light from the xenon lamp. The highest green emission intensity with a peak at 517 nm and highest initial afterglow intensity were recorded by the sample that was deposited at 350°C. The green peak at 517 nm is attributed to 4f65d1 → 4f7 Eu2+ transitions. AFM images with well defined grains were observed on the films deposited at temperatures higher than 200°C. The EDS elemental composition analysis showed that the films consist of all the main elements of SrAl2O4:Eu2+, Dy3+, i.e., Al, Sr, O. The changes in the film photoluminescence and morphology with the substrate temperature are discussed.},
 year = {2018}
}

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